2026
article
OpenAlex
MAOYIN WANG, Zhijian Zhang, ZHEN WANG, JIANBIN GUO et autres
Traditional metal–semiconductor–metal photodetectors (MSM) based on 4H SiC typically have relatively low zero-bias photo-response due to insufficient internal electric fields. To address this issue, we integrated a thermally evaporated p-type organic semiconductor (C8-BTBT) onto an n-type 4H-SiC MSM device to form a …
2026
article
OpenAlex
Peng Liao, Yanghao Wang, Xiaona Ma, Jianbin Guo et autres
Silicon carbide (SiC) MOSFETs are emerging as key components in next-generation electric vehicle powertrains, owing to their superior material properties. However, under automotive harsh conditions such as load dump or inductive shutdown, the device may experience extreme drain voltage stress near or …
cn
(code pays fourni par la source)
2026
article
OpenAlex
Dong Zou, Yanghao Wang, Peng Liao, Xi Chen et autres
Insulated gate bipolar transistors (IGBTs) are subjected to critical combined gate-collector voltage stress under extremeoff-state blocking andon-state saturation conditions, presenting serious reliability challenges. This study identifies a severe degradation mode under such conditions and clarifies its physical origin. Electrical measurements and TCAD …
cn
(code pays fourni par la source)
Accès ouvert
2026
other
OpenAlex
IEEE International Symposium on Reliability Physics 2026, Jianbin Guo, Peng Liao, Qingqing Sun et autres
This work investigates stepwise breakdown–induced degradation in commercial 1200V SiC MOSFETs with planar gate (PG), asymmetric trench (AT), and double trench (DT) structures. Under stepwise drain voltage stress, PG and AT exhibit hard breakdown with distinct pre- and post-breakdown stages, while DT …
cn
(code pays fourni par la source)
Accès ouvert
2025
article
OpenAlex
Mu Chen, Mingzhe Zhao, Yuli Yang, Xin Cui et autres
The administrative-driven hierarchical management (ADHM) refers to the management model that general practitioners act as "voluntary gatekeepers" under local government policy incentives in the non-mandatory hierarchical medical system. However, the impact of ADHM of atrial fibrillation (AF) on cardiovascular events remains unclear. …
cn
(code pays fourni par la source)
Accès ouvert
2025
article
OpenAlex
Zhengwei Jing, Wenhui Chang, Hongyuan Wang, Chao Zhou et autres
Objective This study aimed to compare HIV-related knowledge, attitudes, sexual behaviors, and social networking between MSM college students with and without HIV infection, and to identify associated factors sustaining the high HIV prevalence in this population. Methods A cross-sectional survey was conducted …
cn, gb
(code pays fourni par la source)
Accès ouvert
2025
article
OpenAlex
Wenrong Cui, Peng Liao, Yanghao Wang, Jianbin Guo et autres
This study explores the temperature dependence of reverse-recovery behavior in superjunction metal-oxide-semiconductor field-effect-transistors (MOSFETs) using experiments and Technology Computer-Aided Design (TCAD) simulations. Results show that at 145 °C, switching failure occurs due to severe reverse-recovery degradation. The main cause is the temperature-induced …
cn
(code pays fourni par la source)
2025
conference-paper
OpenAlex
Hang Xu, Jianbin Guo, Peng Liao, Yanghao Wang et autres
2025
conference-paper
OpenAlex
Peng Liao, Yanghao Wang, Jianbin Guo, Qingqing Sun et autres
Accès ouvert
2025
article
OpenAlex
Xueyi Wei, Xiuwen Chen, Liqing Yue, Peng Liao
This qualitative study aimed to better understand parents' information needs and perceptions of chatbots for self-medicating their children and developing chatbots for self-medication. A qualitative study was employed. Semi-structured interviews were conducted from October 2023 to December 2023. The interview data were …
cn, us
(code pays fourni par la source)
2025
article
OpenAlex
Peng Liao, Yanghao Wang, Jianbin Guo, Zhijian Zhang et autres
This work presents a comprehensive investigation into the reliability degradation behaviors ofn-type fin field effect transistor (N-FinFET) devices under alternating current (ac) stress conditions, with a particular emphasis on the interplay between positive bias temperature instability (PBTI), hot carrier degradation (HCD), and …
cn
(code pays fourni par la source)
2025
article
OpenAlex
Hang Xu, Jianbin Guo, Peng Liao, Yanghao Wang et autres
This study presents a novel 1T-memory with an embedding TFET, which enables programming via band-to-band tunneling (BTBT). Conventional floating gate devices rely mainly on hot carrier injection (HCI) to work. By replacing HCI with BTBT, the required operating voltage, operating time, and …
cn
(code pays fourni par la source)