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Profil bibliographique

P. Poncharal

Informations fournies par OpenAlex. Research Africa ne déduit ni nationalité, ni poste, ni coordonnées personnelles.

86Publications signalées
8462Citations signalées
1Affiliations récentes

Les institutions déclarées

Les domaines associés

Carbon Nanotubes in CompositesForce Microscopy Techniques and ApplicationsGraphene research and applicationsMechanical and Optical ResonatorsDiamond and Carbon-based Materials Research

Les publications récentes

Accès ouvert 2024 article OpenAlex

Is the linear relationship between the slope and intercept observed in field emission S-K plots an artifact?

Anthony Ayari, Pascal Vincent, S. Perisanu, P. Poncharal et autres

The performance of field emitters is usually analyzed by linear fitting of a Fowler–Nordheim plot. It has sometimes been observed that the fitted slopes and intercepts show a strong correlation, but no convincing explanation has been provided. We propose a simple model …

fr (code pays fourni par la source)

1 citation Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
2023 article OpenAlex

Electromechanical resonances and field-emission-induced self-oscillations of single crystal diamond needles

Victor I. Kleshch, Р. Р. Исмагилов, Vsevolod V. Mukhin, Anton S. Orekhov et autres

Due to its outstanding mechanical characteristics, diamond is an ideal material for use in micro- and nano-electromechanical systems. In this paper, we report on the investigation of vibrational properties of singly clamped needlelike diamond microcrystallites with nanoscale tips. The single-crystal diamond needles …

ru, fr (code pays fourni par la source)

8 citations Applied Physics Letters
Accès ouvert 2023 article OpenAlex

All field emission experiments are noisy, … are any meaningful?

Anthony Ayari, Pascal Vincent, S. Perisanu, P. Poncharal et autres

Representing field emission data on a Fowler–Nordheim plot is both very common and strongly not recommended. It leads to a spurious estimation of the emitter parameters despite a very good data fit. There is a lack of a reliable method of analysis …

fr (code pays fourni par la source)

13 citations Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
Accès ouvert 2022 article OpenAlex

Negative differential resistance in photoassisted field emission from Si nanowires

M. Choueib, Arnaud Derouet, Pascal Vincent, Anthony Ayari et autres

Field emission (FE) from semiconducting nanowires (NWs) is studied for expanding electron gun performances and functionality in terms of stability, brightness, and pulsed emission. Here, we report on a pronounced and robust double negative differential resistance (NDR) in the FE IV characteristics …

fr, ca (code pays fourni par la source)

2 citations Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
Accès ouvert 2022 article OpenAlex

All field emission models are wrong, … but are any of them useful?

Anthony Ayari, Pascal Vincent, S. Perisanu, P. Poncharal et autres

Field emission data are often represented on a Fowler–Nordheim plot but a new empirical equation has been recently proposed to better analyze experiments. Such an equation is based on approximations of the Murphy and Good model and predicts that a constant parameter …

fr (code pays fourni par la source)

15 citations Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
2021 conference-paper OpenAlex

Does a banal tungsten field emitter obey the field emission theory?

Anthony Ayari, Pascal Vincent, S. Perisanu, P. Poncharal et autres

Prompt by new theoretical propositions challenging the Fowler-Nordheim theory, we carried out field emission studies on the archetypal tungsten tip in a UHV environment. We tried different characterization methods in order to extract physical parameters more reliably. However, the different methods proposed …

fr (code pays fourni par la source)

2 citations

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