Maciej Kretkowski

UV‐Enhanced Scanning Electron Microscope: Toward Orientation and Electron Work Function Imaging

Maciej Kretkowski, Haoran Mu, Hsin‐Hui Huang, Krishna Prassad Khakurel et autres

Deep‐UV ∼250 nm (4.96 eV) tilted in situ co‐illumination of the sample under imaging by a scanning electron microscope (SEM) is developed at a robust and practical instrument level. Precise mechanical control of the lateral position and tilt angle (within 6.5° from …

jp, au, cz, lt (code pays fourni par la source)

UV-enhanced SEM: towards orientation and electron work function imaging

Maciej Kretkowski, Haoran Mu, Hsin‐Hui Huang, Krishna Prasad Khakurel et autres

Deep-UV ~ 250 nm (4.96 eV) tilted in-situ co-illumination of the sample under imaging by scanning electron microscope (SEM) is developed at a robust and practical instrument level. Precise mechanical control of the lateral position and tilt angle (within 6.5$^\circ$ from a …

UV-enhanced SEM: towards orientation and electron work function imaging

Maciej Kretkowski, Haoran Mu, Hsin‐Hui Huang, Krishna Prasad Khakurel et autres

Deep-UV ~ 250 nm (4.96 eV) tilted in-situ co-illumination of the sample under imaging by scanning electron microscope (SEM) is developed at a robust and practical instrument level. Precise mechanical control of the lateral position and tilt angle (within 6.5$^\circ$ from a …

jp, au, cz (code pays fourni par la source)

In-situ resolution assessment and calibration tool for optimal sample plane determination in inverted scanning electron microscope

Maciej Kretkowski, Krishna Prasad Khakurel, Yu Masuda, S. Yamazaki et autres

Abstract Modern correlative microscopy and imaging techniques, such as inverted Scanning Electron Microscopy (SEM) and its super-resolution application, Direct Electron Beam Excitation Assisted SEM (D-EXA SEM), are rapidly advancing. In an inverted SEM, particularly one employing an open atmospheric sample chamber with …

jp, cz (code pays fourni par la source)

Boosting Productivity of a Direct Electron Beam Assisted Scanning Electron Microscope with a Multi-position Sample Turret

Maciej Kretkowski, Hiroyuki Futamata, Wataru Inami, Yoshimasa Kawata

jp (code pays fourni par la source)

Contrast Enhancement of SEM Image Using Photoelectric Effect Under UV LED Irradiation

Lukita Sari Ikhsan, Yu Masuda, Maciej Kretkowski, Wataru Inami et autres

Scanning electron microscopy (SEM) is widely used for nanoscale imaging and the study of surface fine structure. However, its image quality is often limited by low secondary electron (SE) yield and surface charging, especially on insulating or micro-structured materials. In this study, …

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Optimization of Coating Strategies and Evaluating Performance of NaGdF4:Yb,Er Upconversion Films on Silicon Nitride Membrane for Electron Beam Excitation-Assisted Optical Microscope toward High-Resolution Bioimaging Applications

Santhana Vedi, Kei Hosomi, Maciej Kretkowski, Yu Masuda et autres

Electron Beam Excitation-Assisted (EXA) optical microscope is a revolutionary microscopy technique that has been recently developed for achieving high-resolution biological imaging. In the EXA optical microscope, the EXA cathodoluminescence, facilitated by the nanoparticle layer, acts as a bridge film, enabling interaction between …

in, cn, jp, gb, fr, us (code pays fourni par la source)

Femtosecond Laser Textured Surfaces for Radiative Cooling: Black Metals

Nan Zheng, Ričardas Buividas, Hsin‐Hui Huang, Dominyka Stonytė et autres

There is a growing need for novel methods to modify the surfaces of a wide range of materials over large areas. Here, we demonstrate the creation of low-reflectance (R<2%) surfaces in the near-to-mid infrared (IR) spectral window of 2–20 μm by ablating …

au, lt, jp (code pays fourni par la source)

Femtosecond Laser Textured Surfaces for Radiative Cooling: Black Metals

Nan Zheng, Ričardas Buividas, Hsin‐Hui Huang, Dominyka Stonytė et autres

There is a growing need for cost-effective methods for modifying the surfaces of a wide range of materials over large areas. Here, low reflectance R < 2% surfaces have been created over the near-to-mid IR spectral window of 2−20μm by ablating W, …

au, lt, jp (code pays fourni par la source)

Promising transition metal molybdate (TMM) single phase microstructures for asymmetric supercapacitor and photocatalytic applications

Priyadharshini Shanmugam, Kei Hosomi, Ramesh Rajendran, Balaji Krishnasamy et autres

in, jp (code pays fourni par la source)

Fast Sample Switching Mechanism for Atmospheric Scanning Electron Microscopy and Electron Beam Irradiation Systems of Living Cells

Maciej Kretkowski, Kei Hosomi, Hiroyuki Futamata, Wataru Inami et autres

Atmospheric scanning electron microscopy is a technique that enables high-resolution imaging of living specimens and targeted irradiation of specific regions of interest in the sample. To produce a highly focused electron beam, a high vacuum is required inside the electron gun column. …

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Laser Machining at High ∼PW/cm2 Intensity and High Throughput

Nan Zheng, Ričardas Buividas, Hsin‐Hui Huang, Dominyka Stonytė et autres

Laser machining by ultra-short (sub-ps) pulses at high intensity offers high precision, high throughput in terms of area or volume per unit time, and flexibility to adapt processing protocols to different materials on the same workpiece. Here, we consider the challenge of …

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