2026
conference-abstract
OpenAlex
Linyong Pang, Mohamed Ramadan, Grace Dai, Kechang Wang
The lithography and photomask industry have reached a pivotal inflection point: entirely curvilinear inverse lithography technology (ILT) is now accessible to every semiconductor manufacturer, at every technology node. This paper presents an end-to-end entirely curvilinear ILT solution that integrates GPU-accelerated stitchless full-chip …
2024
article
OpenAlex
Linyong Pang, Danping Peng
tw
(code pays fourni par la source)
2024
conference-paper
OpenAlex
Linyong Pang, Dakota Seal, Tom Boettiger, Nagesh Shirali et autres
In the rapidly changing photomask industry, the shift from conventional Manhattan masks to curvilinear masks marks a pivotal development. This transformation is largely driven by advancements in multi-beam mask writer technologies, which bring notable improvements to both mask manufacturing and wafer production. …
us
(code pays fourni par la source)
2024
article
OpenAlex
Linyong Pang, Aki Fujimura
The photomask industry is experiencing a fundamental shift from Manhattan masks to curvilinear masks. In the recent lithography and mask technology conferences, there were many papers and talks on curvilinear masks, curvilinear optical proximity correction, curvilinear inverse lithography technology (ILT), curvilinear mask …
2024
conference-paper
OpenAlex
Linyong Pang, Dakota Seal, Tom Boettiger, Nagesh Shirali et autres
In the evolving landscape of the photomask industry, the transition from traditional Manhattan masks to curvilinear masks represents a significant shift. This evolution is driven by the adoption of multi-beam mask writing technologies, offering substantial improvements for both mask production and wafer …
us
(code pays fourni par la source)
2024
article
OpenAlex
Linyong Pang, Dakota Seal, Tom Boettiger, Nagesh Shirali et autres
One of the most significant changes happening now in the photomask industry is the move from Manhattan masks to curvilinear masks. This change is enabled by multi-beam mask writers and is motivated by benefits to both mask and wafer by using curvilinear …
us
(code pays fourni par la source)
2024
conference-paper
OpenAlex
Linyong Pang, Aki Fujimura
The photomask industry is experiencing a fundamental shift from Manhattan masks to curvilinear masks. In the recent lithography and mask technology conferences, there were many papers and talks on curvilinear masks, curvilinear OPC, curvilinear ILT, curvilinear mask process correction (MPC), and curvilinear …
2024
article
OpenAlex
Linyong Pang, Sha Lu, Ezequiel Vidal Russell, Yang Lu et autres
Full-chip curvilinear inverse lithography technology (ILT) requires mask writers to write full reticle curvilinear mask patterns in a reasonable write time. We jointly study and present the benefits of a full-chip, curvilinear, stitchless ILT with mask-wafer co-optimization (MWCO) for variable-shaped beam (VSB) …
us
(code pays fourni par la source)
Accès ouvert
2021
article
OpenAlex
Linyong Pang
The Journal of Micro/Nanopatterning, Materials, and Metrology (JM3) publishes peer-reviewed papers on the core enabling technologies that address the patterning needs of the electronics industry.
us
(code pays fourni par la source)
Accès ouvert
2021
article
OpenAlex
Linyong Pang, Ezequiel Vidal Russell, Bill Baggenstoss, Michael Lee et autres
Background: Multi-beam mask writers have been one of the most significant additions to the semiconductor manufacturing equipment arsenal in over a decade. The ability of multi-beam mask writers to write masks with a constant write time regardless of mask shapes or complexity …
us
(code pays fourni par la source)
2021
article
OpenAlex
Linyong Pang
In lithography, optical proximity and process bias/effects need to be corrected to achieve the best wafer print. Efforts to correct for these effects started with a simple bias, adding a hammer head in line-ends to prevent line-end shortening. This first-generation correction was …
us
(code pays fourni par la source)
2021
conference-paper
OpenAlex
Linyong Pang, L. Wang, Xiaojun Mao
cn
(code pays fourni par la source)