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Profil bibliographique

Linyong Pang

Informations fournies par OpenAlex. Research Africa ne déduit ni nationalité, ni poste, ni coordonnées personnelles.

93Publications signalées
903Citations signalées
0Affiliations récentes

Les domaines associés

Advancements in Photolithography TechniquesIndustrial Vision Systems and Defect DetectionElectron and X-Ray Spectroscopy TechniquesWelding Techniques and Residual StressesNanofabrication and Lithography Techniques

Les publications récentes

2026 conference-abstract OpenAlex

End-to-end entirely curvilinear ILT solution for everyone

Linyong Pang, Mohamed Ramadan, Grace Dai, Kechang Wang

The lithography and photomask industry have reached a pivotal inflection point: entirely curvilinear inverse lithography technology (ILT) is now accessible to every semiconductor manufacturer, at every technology node. This paper presents an end-to-end entirely curvilinear ILT solution that integrates GPU-accelerated stitchless full-chip …

0 citations
2024 conference-paper OpenAlex

Curvilinear masks: motivations and metrology

Linyong Pang, Dakota Seal, Tom Boettiger, Nagesh Shirali et autres

In the rapidly changing photomask industry, the shift from conventional Manhattan masks to curvilinear masks marks a pivotal development. This transformation is largely driven by advancements in multi-beam mask writer technologies, which bring notable improvements to both mask manufacturing and wafer production. …

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2 citations
2024 article OpenAlex

Why the mask world is moving to curvilinear

Linyong Pang, Aki Fujimura

The photomask industry is experiencing a fundamental shift from Manhattan masks to curvilinear masks. In the recent lithography and mask technology conferences, there were many papers and talks on curvilinear masks, curvilinear optical proximity correction, curvilinear inverse lithography technology (ILT), curvilinear mask …

7 citations Journal of Micro/Nanopatterning Materials and Metrology
2024 conference-paper OpenAlex

Curvilinear mask metrology: What’s the 2D equivalent of CD?

Linyong Pang, Dakota Seal, Tom Boettiger, Nagesh Shirali et autres

In the evolving landscape of the photomask industry, the transition from traditional Manhattan masks to curvilinear masks represents a significant shift. This evolution is driven by the adoption of multi-beam mask writing technologies, offering substantial improvements for both mask production and wafer …

us (code pays fourni par la source)

2 citations
2024 article OpenAlex

Curvilinear mask metrology: what is the equivalent critical dimension?

Linyong Pang, Dakota Seal, Tom Boettiger, Nagesh Shirali et autres

One of the most significant changes happening now in the photomask industry is the move from Manhattan masks to curvilinear masks. This change is enabled by multi-beam mask writers and is motivated by benefits to both mask and wafer by using curvilinear …

us (code pays fourni par la source)

6 citations Journal of Micro/Nanopatterning Materials and Metrology
2024 conference-paper OpenAlex

Why the mask world is moving to curvilinear

Linyong Pang, Aki Fujimura

The photomask industry is experiencing a fundamental shift from Manhattan masks to curvilinear masks. In the recent lithography and mask technology conferences, there were many papers and talks on curvilinear masks, curvilinear OPC, curvilinear ILT, curvilinear mask process correction (MPC), and curvilinear …

8 citations
2024 article OpenAlex

Make the impossible possible: use variable-shaped beam mask writers and curvilinear full-chip inverse lithography technology for 193i contacts/vias with mask-wafer co-optimization

Linyong Pang, Sha Lu, Ezequiel Vidal Russell, Yang Lu et autres

Full-chip curvilinear inverse lithography technology (ILT) requires mask writers to write full reticle curvilinear mask patterns in a reasonable write time. We jointly study and present the benefits of a full-chip, curvilinear, stitchless ILT with mask-wafer co-optimization (MWCO) for variable-shaped beam (VSB) …

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7 citations Journal of Micro/Nanopatterning Materials and Metrology
Accès ouvert 2021 article OpenAlex

Special Section Guest Editorial: Deep Learning

Linyong Pang

The Journal of Micro/Nanopatterning, Materials, and Metrology (JM3) publishes peer-reviewed papers on the core enabling technologies that address the patterning needs of the electronics industry.

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2 citations Journal of Micro/Nanopatterning Materials and Metrology
Accès ouvert 2021 article OpenAlex

Breakthrough curvilinear ILT enabled by multi-beam mask writing

Linyong Pang, Ezequiel Vidal Russell, Bill Baggenstoss, Michael Lee et autres

Background: Multi-beam mask writers have been one of the most significant additions to the semiconductor manufacturing equipment arsenal in over a decade. The ability of multi-beam mask writers to write masks with a constant write time regardless of mask shapes or complexity …

us (code pays fourni par la source)

10 citations Journal of Micro/Nanopatterning Materials and Metrology
2021 article OpenAlex

Inverse lithography technology: 30 years from concept to practical, full-chip reality

Linyong Pang

In lithography, optical proximity and process bias/effects need to be corrected to achieve the best wafer print. Efforts to correct for these effects started with a simple bias, adding a hammer head in line-ends to prevent line-end shortening. This first-generation correction was …

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85 citations Journal of Micro/Nanopatterning Materials and Metrology

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