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Profil bibliographique

Jeong Gyu Yoo

Informations fournies par OpenAlex. Research Africa ne déduit ni nationalité, ni poste, ni coordonnées personnelles.

6Publications signalées
104Citations signalées
1Affiliations récentes

Les institutions déclarées

Les domaines associés

Ferroelectric and Negative Capacitance DevicesFerroelectric and Piezoelectric MaterialsMXene and MAX Phase MaterialsSemiconductor materials and devicesAdvanced Sensor and Energy Harvesting Materials

Les publications récentes

2025 article OpenAlex

Thermal budget study to simultaneously achieve low-temperature ( < 400 ° C) process and high endurance of ferroelectric Hf0.5Zr0.5O2 thin films

Jongmug Kang, Hye Ryeon Park, Seungbin Lee, Jin-Hyun Kim et autres

This work comprehensively investigates the thermal budget required to simultaneously achieve low-temperature process conditions and high endurance in atomic layer deposited ferroelectric Hf0.5Zr0.5O2 (HZO) thin films. Because a certain level of thermal budget is required to achieve ferroelectricity in 10 nm HZO …

kr, us (code pays fourni par la source)

9 citations Applied Physics Letters
2023 conference-paper OpenAlex

A Study on the Thermal Budget of Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Capacitors for Next-Generation Memory Applications

Hye Ryeon Park, Jeong Gyu Yoo, Jong Mook Kang, Min Kwan Cho et autres

In this study, the thermal budget of atomic layer deposited Hf0.5Zr0.5O2(HZO) thin films have been investigated for memory applications. Specifically, using a furnace as a crystallization method of the HZO thin film, TiN/HZO/TiN capacitors were fabricated under various annealing temperature (300-500°C) and …

kr, us (code pays fourni par la source)

4 citations
Accès ouvert 2023 article OpenAlex

Furnace Annealing Effect on Ferroelectric Hf0.5Zr0.5O2 Thin Films

Min Kwan Cho, Jeong Gyu Yoo, Hye Ryeon Park, Jong Mook Kang et autres

The ferroelectricity in Hf0.5Zr0.5O2 (HZO) thin films is one of the most interesting topics for next-generation nonvolatile memory applications. It is known that a crystallization process is required at a temperature of 400℃ or higher to form an orthorhombic phase that results …

kr, us (code pays fourni par la source)

3 citations Journal of the Korean Institute of Electrical and Electronic Material Engineers
2021 article OpenAlex

Low-thermal-budget (300 °C) ferroelectric TiN/Hf0.5Zr0.5O2/TiN capacitors realized using high-pressure annealing

Si Joon Kim, Yong Chan Jung, Jaidah Mohan, Hyojeong Kim et autres

In this Letter, a high-pressure annealing (HPA) process is proposed as a way to reduce the thermal budget of Hf0.5Zr0.5O2 (HZO) thin films with ferroelectric behaviors. The low-thermal-budget process is essential for integrating ferroelectric devices in the back-end-of-line to provide more functionalities …

kr, us (code pays fourni par la source)

40 citations Applied Physics Letters
Accès ouvert 2021 article OpenAlex

Low‐Thermal‐Budget Fluorite‐Structure Ferroelectrics for Future Electronic Device Applications

Hyojeong Kim, Yonghwan An, Yong Chan Jung, Jaidah Mohan et autres

In article number 2100028, Jiyoung Kim, Si Joon Kim, and co-workers comprehensively review the various factors such as doping effects, deposition method, annealing method and conditions, and substrate material for obtaining fluorite-structure ferroelectrics with low-thermal-budget processes (400 °C or less). These low-thermal-budget …

us, kr (code pays fourni par la source)

6 citations physica status solidi (RRL) - Rapid Research Letters
2021 article OpenAlex

Low‐Thermal‐Budget Fluorite‐Structure Ferroelectrics for Future Electronic Device Applications

Hyojeong Kim, Yonghwan An, Yong Chan Jung, Jaidah Mohan et autres

Since the first report on the unexpected ferroelectricity of fluorite‐structure oxides in 2011, this topic has provided a pathway for new research directions and opportunities. Based on theoretical calculations and experimental demonstrations, it is now well known that fluorite‐structure ferroelectrics are compatible …

us, kr (code pays fourni par la source)

42 citations physica status solidi (RRL) - Rapid Research Letters

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