James Bishop

Hydrogen Plasma Inhibits Ion Beam Restructuring of GaP

John A. Scott, James Bishop, Garrett Budnik, Milos Toth

Focused ion beam (FIB) techniques are employed widely for nanofabrication and processing of materials and devices. However, ion irradiation often gives rise to severe damage due to atomic displacements that cause defect formation, migration, and clustering within the ion-solid interaction volume. The …

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Suppression of Surface Roughening during Ion Bombardment of Semiconductors

John A. Scott, James Bishop, Milos Toth

Ion beams are used routinely for processing of semiconductors, particularly sputtering, ion implantation, and direct-write fabrication of nanostructures. However, the utility of ion beam techniques is limited by crystal damage and surface roughening. Damage can be reduced or eliminated by performing irradiation …

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Recoil implantation using gas-phase precursor molecules

Angus Gale, Johannes E. Fröch, Mehran Kianinia, James Bishop et autres

Ion implantation underpins a vast range of devices and technologies that require precise control over the physical, chemical, electronic, magnetic and optical properties of materials. A variant termed "recoil implantation" - in which a precursor is deposited onto a substrate as a …

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Role of knock-on in electron beam induced etching of diamond

Marco Fronzi, James Bishop, Aiden A. Martin, M. Hussein N. Assadi et autres

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Ultra-high aspect ratio pores milled in diamond via laser, ion and electron beam mediated processes

Aiden A. Martin, James Bishop, W. Burnett, N. Alfonso et autres

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Plastic Deformation of Single‐Crystal Diamond Nanopillars

Blake Regan, Alireza Aghajamali, Johannes Froech, Toan Trong Tran et autres

Abstract Diamond is known to possess a range of extraordinary properties that include exceptional mechanical stability. In this work, it is demonstrated that nanoscale diamond pillars can undergo not only elastic deformation (and brittle fracture), but also a new form of plastic …

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Fundamental advances in focused electron beam induced processing

James Bishop

Focused electron beam induced processing (FEBIP) is a direct-write nanofabrication technique that utilizes the electron beam of a scanning electron microscope (SEM). It encompasses the sub-techniques of electron beam induced deposition (EBID) and electron beam induced etching (EBIE). Deposition or etching is …

Encapsulation-Free Stabilization of Few-Layer Black Phosphorus

Christopher Elbadawi, R. Tormo-Queralt, Zai‐Quan Xu, James Bishop et autres

environments, reactive oxygen species (ROS) cause immediate degradation of the mobility of few-layer black phosphorus (FLBP). Here, we show that FLBP degradation can be prevented by maintaining the temperature in the range ∼125-300 °C during ROS exposure. FLBP devices maintained at elevated …

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Bottom up engineering of near-identical quantum emitters in atomically thin materials

Noah Mendelson, Zai‐Quan Xu, Toan Trong Tran, Mehran Kianinia et autres

Quantum technologies require robust and photostable single photon emitters (SPEs) that can be reliably engineered. Hexagonal boron nitride (hBN) has recently emerged as a promising candidate host to bright and optically stable SPEs operating at room temperature. However, the emission wavelength of …

Controlling Surface Patterning of Diamond: The Origin of Anisotropy with Electron Beam Induced Etching

Marco Fronzi, James Bishop, Milos Toth, Michael J. Ford

Deterministic Nanopatterning of Diamond Using Electron Beams

James Bishop, Marco Fronzi, Christopher Elbadawi, Vikram Nikam et autres

Diamond is an ideal material for a broad range of current and emerging applications in tribology, quantum photonics, high-power electronics, and sensing. However, top-down processing is very challenging due to its extreme chemical and physical properties. Gas-mediated electron beam-induced etching (EBIE) has …

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Formation of Dynamic Topographic Patterns During Electron Beam Induced Etching of Diamond

Aiden A. Martin, Alan S. Bahm, James Bishop, Igor Aharonovich et autres

Aiden A Martin, Alan Bahm, James Bishop, Igor Aharonovich, Milos Toth; Formation of Dynamic Topographic Patterns During Electron Beam Induced Etching of Di

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