Ag@Au@4-NPH@ZIF-8 based nucleophilic addition strategy for SERS detection of gaseous acetone
Yuyu Peng, Chunyan Wang, Xiwang Li, Xiaofeng Zhou et autres
cn (code pays fourni par la source)
Informations fournies par OpenAlex. Research Africa ne déduit ni nationalité, ni poste, ni coordonnées personnelles.
Yuyu Peng, Chunyan Wang, Xiwang Li, Xiaofeng Zhou et autres
cn (code pays fourni par la source)
Yuyu Peng, Chunyan Wang, Gen Li, Jianguo Cui et autres
In this study, a MOF-199/Ag@Au SERS sensing structure was successfully synthesized by combining metal–organic frameworks (MOFs) with surface-enhanced Raman scattering (SERS) technology for the efficient detection of dopamine (DA), a biomarker for neurological diseases, in serum. Using electrochemical methods, a copper-based MOF …
cn (code pays fourni par la source)
Chunyan Wang, Yuyu Peng, Jia Huo
Surface-enhanced Raman spectroscopy (SERS) is a promising and highly sensitive molecular fingerprint detection technology. However, the development of SERS nanocomposites that are label-free, highly sensitive, selective, stable, and reusable for gaseous volatile organic compounds (VOCs) detection remains a challenge. Here, we report …
cn, mn (code pays fourni par la source)
Shiqi Liang, Min Ren, Yuyu Peng, Chun-Ying Zhou et autres
The Panel level package (PLP) is gradually applied to some power devices due to its lower parasitic parameters, lower material cost, and higher packaging efficiency. In most application scenarios, the solder layer fatigues with temperature fluctuations. Thermal cycling life prediction is an …
cn (code pays fourni par la source)
Li Chen, Wei Gao, Yan Huo, Lei Xie et autres
This article analyzed the temperature cycling test failure root cause and molding film crack mechanism of a panel level fan-out QFN package. Improvement actions are proposed according to Kitagawa-Takahashi diagram. In the micro crack stage, reducing the thermal stress is the key …
cn (code pays fourni par la source)
Yuyu Peng, Wei Gao, Qiao Guo, Bo Zhang
With the development of power devices, the thermal reliability of power devices has become a research hot spot. The research object of this paper is the power diode of SMBF package. Through X-ray scanning and resin removal observation, it can be concluded …
cn (code pays fourni par la source)
Wei Gao, Qiao Guo, Yuyu Peng, Min Ren et autres
Solder layer void is one of the causes of thermal failure for power semiconductor device. In this study, influence of solder layer void with different diameter and position on the thermal stability for power device in different package form is observed and …
cn (code pays fourni par la source)
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