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Profil bibliographique

Yixin Qin

Informations fournies par OpenAlex. Research Africa ne déduit ni nationalité, ni poste, ni coordonnées personnelles.

17Publications signalées
130Citations signalées
1Affiliations récentes

Les institutions déclarées

Les domaines associés

Ferroelectric and Negative Capacitance DevicesSemiconductor materials and devicesAdvanced Memory and Neural ComputingFerroelectric and Piezoelectric MaterialsAdvancements in Semiconductor Devices and Circuit Design

Les publications récentes

2025 conference-paper OpenAlex

Atomic Layer Deposited Amorphous Ge-Doped Indium Oxide with Enhanced Mobility-Stability-Crystallization Resistance Tradeoff

Yushan Lee, Xingtian Wang, Jiahui Duan, Guanyu Zhou et autres

In this work, we demonstrate the potential of germanium-doped indium oxide (Ge:In2O3) as a promising oxide semiconductor offering an improved tradeoff among mobility, electrical stability, and crystallization resistance. This makes it suitable for both500 °C 1T1C DRAM process. Through a comparative study …

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3 citations
2025 article OpenAlex

Forming Process in BEOL Oxide Channel Ferroelectric FET

Xuezhong Niu, Shan Zhi Deng, Fu-Xiang Liang, Khandker Akif Aabrar et autres

In this work, we report the observation of a forming step in the back-end-of-line (BEOL) oxide channel ferroelectric FET (FeFET). This behavior has typically been neglected but is deeply rooted in the polarization switching mechanism. It could support one-time programmability (OTP) on …

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0 citations IEEE Transactions on Electron Devices
2025 conference-paper OpenAlex

Engineering MSMFM Structure Composed of Compound Bi-Directional Selector and Ferroelectric Capacitor for High Density Capacitor Arrays

John A. Howe, Yixin Qin, Shan Zhi Deng, Kai Ni

Ferroelectric hafnium oxide (HfO2) thin films have the potential to enable high density, non-volatile memory that can further the advancement of compute in memory (CiM) architectures [1]. The metal-ferroelectric-metal (MFM) capacitor is such a device that is highly scalable and easily integrated …

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0 citations
2025 conference-paper OpenAlex

Vertical 2T-nC FeRAM Demonstration: BEOL Read Transistor for 4F 2 Memory Strings and Two-Terminal Selector Design for Polarization Disturb Mitigation

Shan Zhi Deng, John A. Howe, Shawming Ma, Sadik Yasir Tauki et autres

In this work, we demonstrate a vertical 2T-nC FeRAM with a back-end-of-line (BEOL) read transistor ($T_{\mathrm{R}}$) for$4 \mathrm{F}^{2}$string and propose a selector design to mitigate polarization disturb in passive capacitor crossbar arrays. Key contributions include: 1) successful integration and operation composed of …

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5 citations
2025 article OpenAlex

Demonstration of Vertical 2T-nC FeRAM Hybrid Cell and Its Scalability for High-Density 3-D Ferroelectric Capacitor Memory

Yi Nong Xiao, Shan Zhi Deng, Zhouhang Jiang, Yixin Qin et autres

In this work, we present a comprehensive experimental and modeling study on the scaling of vertical 2T-nC ferroelectric random access memory (FeRAM) hybrid cells, comprising n metal–ferroelectric–metal (MFM) capacitors, to demonstrate a high-performance and high-density 3-D capacitor memory. Our contributions include: 1) …

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6 citations IEEE Transactions on Electron Devices
2025 article OpenAlex

Synaptic Weight Cell Enabled by Ferroelectric FETs With Gate Side Charge Injection

Qi Zheng, Yixin Qin, Suhwan Lim, Kijoon Kim et autres

The ferroelectric field-effect transistor (FeFET) has been extensively studied as a synaptic weight cell due to its ability to tune conductance states via partial polarization switching, along with its energy efficiency and scalability. However, a significant challenge arises from the need for …

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1 citation IEEE Electron Device Letters
2025 article OpenAlex

Elucidating the Role of Ferroelectric in Memory Window Expansion of Ferroelectric FETs With Gate-Side Injection

Yixin Qin, Saikat Chakraborty, Zijian Zhao, Shawming Ma et autres

In this work, we present a comprehensive experimental and modeling study to clarify the role of the ferroelectric (FE) layer in enhancing the memory window (MW) of FeFETs with gate-side charge injection. We separated the FE contributions to the MW into remnant …

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6 citations IEEE Transactions on Electron Devices
2025 conference-paper OpenAlex

Investigating Read-After-Write Delay in Ferroelectric FET with Gate-Side Injection

Shawming Ma, Saikat Chakraborty, Yixin Qin, Zijian Zhao et autres

The conventional HfO2-based n-type ferroelectric field-effect transistors (nFeFETs) suffer from read-after-write delay (RAWD), caused by electron detrapping at the channel interface after positive write pulses. In this work, we propose a metal-insulator-ferro-insulator-silicon (MIFIS) nFeFET structure incorporating a SiNxcharge trapping layer between the …

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3 citations
2025 conference-paper OpenAlex

Retention Analysis of Ferroelectric FETs with Gate-Side Injection for Vertical NAND Storage

Yixin Qin, Saikat Chakraborty, Zijian Zhao, Shawming Ma et autres

This study investigates the retention behavior of gate-side injection ferroelectric FETs for vertical NAND applications. Experimental results demonstrate that thicker blocking oxide layers enhance the initial memory window but result in greater retention loss at elevated temperatures due to the higher depolarization …

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3 citations
2025 conference-paper OpenAlex

Non-Volatile Photonic-Electronic Cell for Neuromorphic PICs

Lilian Neim, Hector Rubio Rivera, Matthew van Niekerk, Zijian Zhao et autres

We demonstrate a FeFET-driven microring modulator capable of toggling between memory states via applied pulse voltage, achieving stable hysteresis, resonance shifts, and high extinction ratio, highlighting its potential for low power and efficient non-volatile photonic memory applications.

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0 citations
2024 conference-paper OpenAlex

Clarifying the Role of Ferroelectric in Expanding the Memory Window of Ferroelectric FETs with Gate-Side Injection: Isolating Contributions from Polarization and Charge Trapping

Yixin Qin, Saikat Chakraborty, Zijian Zhao, Kijoon Kim et autres

In this work, we performed a comprehensive experimental and modeling study, clarifying the role of ferroelectric materials in boosting the memory window of FeFETs with gate-side charge injection for the first time. We separated the ferroelectric contributions to the memory window into …

us, kr, sg (code pays fourni par la source)

18 citations
2024 conference-paper OpenAlex

First Demonstration of Vertical 2T-nC FeRAM Hybrid Cell and its Scalability for High-Density 3D Ferroelectric Capacitor Memory

Shan Deng, Yi Nong Xiao, Zhouhang Jiang, Yixin Qin et autres

In this work, we perform a comprehensive experimental and modeling study into the scaling of vertical 2T-nC ferroelectric random-access memory (FeRAM) hybrid cell to demonstrate a high performance and high-density 3D capacitor memory. We demonstrate: i) first time successful integration of the …

us, de, tw, sg (code pays fourni par la source)

9 citations

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