Diffusion reconstruction with validity masks and measurement consistency for low-frame structured illumination microscopy
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Le résumé fourni par la source
Reducing the raw-frame budget of structured illumination microscopy (SIM) lowers exposure burden but weakens orientation–phase diversity and increases sensitivity to noise and model mismatch. We present acquisition-aware physics-guided diffusion for SIM (APD-SIM), which combines a protocol-specific conditional diffusion prior with validity-masked Poisson–Gaussian refinement. Separate synthetic-data checkpoints were trained for controller-defined digital micromirror device (DMD) protocols with three-frame (DMD-3F), six-frame (DMD-6F), and nine-frame (DMD-9F) acquisition modes; no experimental frame was used for training or fine-tuning. On the same 30 held-out fields, the three-, six-, and nine-frame APD-SIM reconstructions (APD-SIM-3, APD-SIM-6, and APD-SIM-9) achieved peak signal-to-noise ratio (PSNR) values of 3 1 . 5 9 5 ± 3 . 8 0 1 , 4 1 . 0 7 8 ± 2 . 8 5 8 , and 4 3 . 4 9 1 ± 2 . 0 8 5 dB, respectively. Corresponding structural similarity index (SSIM) values were 0 . 7 8 5 2 5 ± 0 . 0 8 2 6 7 , 0 . 9 6 9 4 8 ± 0 . 0 2 3 1 6 , and 0 . 9 8 9 9 8 ± 0 . 0 0 6 9 9 , and ground-truth-referenced Fourier ring correlation (FRC) curve areas were 0 . 3 4 1 0 0 8 ± 0 . 0 7 3 2 4 1 , 0 . 3 9 5 6 0 9 ± 0 . 0 6 4 7 8 0 , and 0 . 4 0 7 9 6 3 ± 0 . 0 5 7 0 7 4 . DMD-6F used one-third fewer exposures than DMD-9F. Under byte-identical DMD-6F measurements, protocol-correct masking improved final PSNR by 2 . 9 4 2 dB and SSIM by 0 . 0 2 8 3 8 ; measurement-domain refinement improved the diffusion-only estimate by 1 0 . 9 6 dB and 0 . 3 9 8 , respectively. Relative to machine-learning structured illumination microscopy retrained for six inputs (ML-SIM-6R), APD-SIM-6 showed positive pooled image-domain effects, but their direction and magnitude depended on morphology and metric. Direct measurements from two commercial fixed-cell preparations were reconstructed by the complete two-stage pipeline using frozen protocol-specific checkpoints and fixed nominal hardware forward models. The hardware results provide qualitative evidence of zero-shot simulation-to-experiment transfer rather than a calibrated quantitative benchmark.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Diffusion reconstruction with validity masks and measurement consistency for low-frame structured illumination microscopy
- Date Crossref
- 01/12/2026
- Éditeur
- Elsevier BV
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Nanchang University pays non établi dans la noticeUniversité ou école supérieure
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School of Information Engineering pays non établi dans la noticeUniversité ou école supérieure
Nanchang University et School of Information Engineering.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.