Degradation, Lifetime, and Failure Modes of Metal Oxide Varistors in Low-Voltage DC Circuit Breaker Applications

Le résumé fourni par la source

The metal oxide varistor (MOV) has been a critical enabling component for emerging applications in low-voltage dc circuit breakers (LVDCCBs). Although its properties align well with this application, its long-term performance, including degradation, failure modes, and service lifetime, remains poorly understood. Based on an accelerated degradation test (ADT) platform, this work collects extensive data to track degradation patterns and identify failure modes using statistical methods. A power-function-based model is proposed to identify the driving forces behind degradation, and a complete lifetime map of LVDCCB MOVs is achieved. The model predicts the lifetime of LVDCCB MOVs with a confidence level of 79.18%. The model and statistical analysis indicate that charge is the driving force for the defined failure mode, which needs to be addressed in the LVDCCB design while energy drives the catastrophic failure mode, which needs to be avoided in the LVDCCB design.

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