Extending Photovoltaic Module Lifetime Through Targeted Repair of Short-Circuited Bypass Diodes

Le résumé fourni par la source

Bypass diode failure, particularly in the short-circuit mode, remains an under-addressed reliability issue in photovoltaic (PV) modules, causing severe power suppression and often leading to premature disposal of otherwise functional units. This study presents a non-destructive, field-applicable plug-in repair protocol for restoring modules affected by short-circuited bypass diodes. From twenty-two field-deployed modules, nine were analyzed in detail under healthy, single-fault, and dual-fault conditions. Controlled diode faults were introduced and subsequently repaired using commercially available plug-in bypass diodes. Electroluminescence (EL) imaging, current–voltage (I–V) testing, and extraction of series and shunt resistances were performed before and after repair. Results show that a single shorted diode deactivates one substring, reducing power by ~34–37%, while dual faults suppress over two-thirds of the active area, causing power losses above 67%. After repair, power deviation decreased to <3% for single faults and <7% for dual faults, with shunt resistance increasing by 52–262%, confirming removal of diode-induced leakage paths. Series resistance remained largely unchanged except in modules with irreversible cell-level damage accumulated during prolonged faulty operation. The findings demonstrate that short-circuited bypass diode faults are readily repairable and that component-level intervention can restore module performance, extend operational lifetime, and reduce unnecessary PV recycling.

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