Reliability Evaluation in Commercial 1653 NM DFB Laser Diode for Methane Detection

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This paper presents a reliability study of 1653 nm single-mode DFB laser diodes designed for methane detection-an area with limited coverage compared to widely studied 1310 nm and 1550 nm InP lasers. These devices, based on InGaAsP/InP multiquantum well structures, offer excellent wavelength stability aligned with methane absorption features. A custom test setup was developed to monitor optical power and emission wavelength in real-time during accelerated lifetime testing (ALT). Thermal resistance and junction temperature were extracted using wavelength shift measurements. The lasers demonstrated stable output and minimal side-mode suppression ratio (SMSR) degradation under moderate stress conditions. At elevated current and temperature, significant optical power degradation was observed. Failure analysis revealed defect formation within the quantum well region, including dislocation propagation triggered by thermal and current-induced stress. Despite this, the estimated device lifetime exceeded$1,000,000$hours, confirming its robustness for long-term deployment. These results not only validate the suitability of 1653 nm DFB lasers for reliable gas sensing applications but also contribute new insights to a relatively underexplored wavelength range in InP-based laser reliability research.

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