Thickness and Uniformity Modeling of the Deposition of Shape Memory Polymers for Information Storage Applications
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Le résumé fourni par la source
Shape memory polymers are of interest as high-capacity information storage media. This research seeks to understand the effects of processing conditions on the following candidate polymers: diethylene glycol dimethacrylate (DEGDMA), tertbutyl acrylate (tBA), and bisphenol. Full factorial experiments were performed using three input factors: spin speed, spin time, and nitrogen flow rate. A total of ten experiments were conducted. The measured responses were film thickness, uniformity, hardness and modulus of the materials. Analysis of variance revealed that all input parameters were significant with respect to the film thickness. The full factorial experiments were augmented to a central composite face (CCF) design to enable response surface modeling. Neural network models were developed to examine relationships between the spin speed and thickness of spin coated films. The average predictability of the model was better than 2% for training and less than 15% in testing. This research is expected to aid in understanding the use of these materials in information storage.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Thickness and Uniformity Modeling of the Deposition of Shape Memory Polymers for Information Storage Applications
- Date Crossref
- 01/05/2008
- Éditeur
- IEEE
- Type
- proceedings-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Georgia Institute of Technology pays non établi dans la noticeUniversité ou école supérieure
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School of Electrical and Computer Engineering pays non établi dans la noticeUniversité ou école supérieure
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School of Materials Science and Engineering pays non établi dans la noticeUniversité ou école supérieure
Georgia Institute of Technology, School of Electrical and Computer Engineering et School of Materials Science and Engineering.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.