Atomistic investigation of various GaN (0001) phases on the 6H−SiC (0001) surface
Rattachement africain : jp, cn. Niveau de preuve : code pays fourni par la source.
Le résumé fourni par la source
A number of superstructures of the GaN (0001) surface have been investigated systematically by reflection high-energy electron diffraction, scanning tunneling microscopy, and first-principles theoretical calculations. The GaN-thin films are grown on the Si-terminated 6H-SiC (0001) surface by an N plasma-assisted molecular-beam epitaxy under the Ga-rich condition. While the as-grown GaN surface is revealed to be a featureless 1\ifmmode\times\else\texttimes\fi{}1 structure, post-growth deposition of Ga at lower temperatures results in the formation of a series of ordered structures, such as 2\ifmmode\times\else\texttimes\fi{}2, 4\ifmmode\times\else\texttimes\fi{}4, 5\ifmmode\times\else\texttimes\fi{}5, $5\sqrt{3}\ifmmode\times\else\texttimes\fi{}2\sqrt{13}$, $\sqrt{7}\ifmmode\times\else\texttimes\fi{}\sqrt{7}$, and 10\ifmmode\times\else\texttimes\fi{}10 in the order of the increasing Ga coverage. An 1\ifmmode\times\else\texttimes\fi{}1-Ga-fluid structure is obtained with the highest Ga coverage. Neither ordered structure nor smooth morphology has been observed under the N-rich regime. We conclude that the atomic structures of all these Ga-rich phases can be described best by a Ga-adatom scheme. We further show that the 5\ifmmode\times\else\texttimes\fi{}5 and $5\sqrt{3}\ifmmode\times\else\texttimes\fi{}2\sqrt{13}$ phases are two configurations that exhibit a unique one-dimensional characteristic in the adatom arrangement. Their structures can be understood by Peierls distortion against Fermi-surface instability under the Ga-adatom scheme.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé, mais le titre doit être comparé manuellement.
- Titre Crossref
- Atomistic investigation of various GaN (0001) phases on the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>6</mml:mn><mml:mi mathvariant="normal">H</mml:mi><mml:mo>−</mml:mo><mml:mi mathvariant="normal">SiC</mml:mi></mml:math>(0001) surface
- Date Crossref
- 15/05/1999
- Éditeur
- American Physical Society (APS)
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Tohoku University Institute for Materials Research pays non établi dans la noticeUniversité ou école supérieure
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Institute of Physics pays non établi dans la noticeStructure de recherche
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National Research Institute of Metals pays non établi dans la noticeStructure de recherche
Institute for Materials Research — Tohoku University, Institute of Physics et National Research Institute of Metals.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.