Thermal Transport through Defects in Rutile with Atomic Resolution STEM-EELS
Martin OŠMERA, Shihao Wang, Julio Alves Do Nascimento, Jack Fawcett-Houghton et autres
Scanning transmission electron microscopy (STEM) with electron energy-loss spectroscopy (EELS) has been used routinely to study the chemical composition of samples with atomic precision for long time. In 2014 monochromation with full-width half-maximum below 10 meV in a modern aberration corrected setup …
se, gb, us (code pays fourni par la source)
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Microscopy and Microanalysis