Confocal structured illumination microscopy for improving the signal-to-noise ratio and depth of fluorescent optical section imaging
Weishuai Zhou, Manhong Yao, Xi Lin, Quan Yu et autres
Light scattering from the sample is an unavoidable problem in fluorescence imaging. Compared with laser scanning confocal scanning microscopy, although optical-sectioning structured illumination microscopy (OS-SIM) has the advantages of fast imaging speed and low phototoxicity, it faces the challenge of removing the …
cn (code pays fourni par la source)
6 citations
Optics Express