Dynamic human reliability and dual-type quality prediction in human-machine collaborative tuning manufacturing systems
Jun Tan, Fabin Mei, Xuerong Ye, Guofu Zhai
cn (code pays fourni par la source)
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Jun Tan, Fabin Mei, Xuerong Ye, Guofu Zhai
cn (code pays fourni par la source)
Haodong Wang, Cen Chen, Chenyi Wang, Guo Yi et autres
Negative bias temperature instability is a typical failure mechanism commonly found in P-channel power MOSFETs. When affected by the negative bias temperature stress, the gate oxide layer of PMOSFET will degrade, resulting in the degradation of device parameters. This degradation may lead …
cn (code pays fourni par la source)
Yufei Qiao, Guofu Zhai, Xinyu Jin, Jiaxin You
cn (code pays fourni par la source)
Junpeng Gao, Zhiwei Zheng, Mingyang Wang, Cen Chen et autres
Operational amplifiers (op-amps) are essential components in modern electronic systems, and their long-term reliability is crucial for maintaining consistent performance. Among various performance metrics, input offset voltage (VOS) is particularly sensitive to aging and serves as a key indicator of reliability degradation. …
cn (code pays fourni par la source)
Yingzhu Han, Huimin Liang, Jiangtao Wu, Zitong Wei et autres
Electromagnetic relays perform critical functions such as control, circuit switching, and safety grounding within power equipment and systems, fulfilling roles that cannot be replaced by semiconductor switches. This paper addresses the issue of low qualification rates caused by the two-step absorption and …
cn (code pays fourni par la source)
Kaiwen Xiao, Cen Chen, Weiming Liu, Shujuan Wang et autres
Switching power supplies are widely used in aerospace, new energy and many other fields. During long-term operation, various electronic components in these supplies experience performance degradation due to continuous electrical and thermal stress, leading to changes in output characteristics. This is the …
cn (code pays fourni par la source)
Lingjie Su, Cen Chen, Hejun Du, Guofu Zhai
In the reliability assessment test of three-phase inverter, the accurate measurement of its output performance parameters and internal key node characteristics parameters is crucial, which can comprehensively reflect its health status and accurately assess its reliability. The paper will examine the EMC …
cn (code pays fourni par la source)
Fabin Mei, Hao Chen, Wenying Yang, Guofu Zhai
cn (code pays fourni par la source)
Xiaohan Liu, Jie Deng, Hao Chen, Guofu Zhai et autres
cn (code pays fourni par la source)
Yingzhu Han, Huimin Liang, Duanlin Jiang, Zitong Wei et autres
Support vector regression (SVR), a machine learning method based on statistical learning theory, is an effective tool for sample training and data prediction. However, limited by its own principles and mechanisms, SVR often needs to adjust internal parameters when facing outliers and …
cn (code pays fourni par la source)
Jun Tan, Hao Chen, Xuerong Ye, Guofu Zhai et autres
The design optimization of a robust, low-cost, and high-quality permanent magnet actuator (PMA) that meets the requirements of industrial applications presents numerous challenges. In particular, uncertainties arising from fabrication, assembly, and degradation are omnipresent and can produce erratic or infeasible solutions, complicating …
cn (code pays fourni par la source)
Yuege Zhou, Xuerong Ye, Guofu Zhai
Component performance degradation and parameter drift due to the effects of environmental condition and operating stress causes the performance measures of electronic system to deviate from the initial design specifications. The non-conformance of performance measures over time is referred as performance reliability, …
cn (code pays fourni par la source)
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