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Profil bibliographique

Guofu Zhai

Informations fournies par OpenAlex. Research Africa ne déduit ni nationalité, ni poste, ni coordonnées personnelles.

12Publications signalées
48Citations signalées
1Affiliations récentes

Les institutions déclarées

Les domaines associés

Machine Fault Diagnosis TechniquesSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesStructural Health Monitoring TechniquesAdvancements in Semiconductor Devices and Circuit Design

Les publications récentes

2025 conference-paper OpenAlex

Multiparametric degradation model of PMOSFETs under negative bias temperature stress

Haodong Wang, Cen Chen, Chenyi Wang, Guo Yi et autres

Negative bias temperature instability is a typical failure mechanism commonly found in P-channel power MOSFETs. When affected by the negative bias temperature stress, the gate oxide layer of PMOSFET will degrade, resulting in the degradation of device parameters. This degradation may lead …

cn (code pays fourni par la source)

0 citations IET conference proceedings.
2025 conference-paper OpenAlex

Reliability Modeling of Operational Amplifiers Considering Bidirectional Degradation of Input Offset Voltage

Junpeng Gao, Zhiwei Zheng, Mingyang Wang, Cen Chen et autres

Operational amplifiers (op-amps) are essential components in modern electronic systems, and their long-term reliability is crucial for maintaining consistent performance. Among various performance metrics, input offset voltage (VOS) is particularly sensitive to aging and serves as a key indicator of reliability degradation. …

cn (code pays fourni par la source)

0 citations
2025 conference-paper OpenAlex

Multi-objective optimization algorithm based on electromagnetic relay parameters

Yingzhu Han, Huimin Liang, Jiangtao Wu, Zitong Wei et autres

Electromagnetic relays perform critical functions such as control, circuit switching, and safety grounding within power equipment and systems, fulfilling roles that cannot be replaced by semiconductor switches. This paper addresses the issue of low qualification rates caused by the two-step absorption and …

cn (code pays fourni par la source)

0 citations IET conference proceedings.
2024 conference-paper OpenAlex

Simulation Method for Reliability Prediction of Switching Power Supply injected with PoF Model

Kaiwen Xiao, Cen Chen, Weiming Liu, Shujuan Wang et autres

Switching power supplies are widely used in aerospace, new energy and many other fields. During long-term operation, various electronic components in these supplies experience performance degradation due to continuous electrical and thermal stress, leading to changes in output characteristics. This is the …

cn (code pays fourni par la source)

2 citations
2024 conference-paper OpenAlex

Development of reliability evaluation test platform for three-phase inverter

Lingjie Su, Cen Chen, Hejun Du, Guofu Zhai

In the reliability assessment test of three-phase inverter, the accurate measurement of its output performance parameters and internal key node characteristics parameters is crucial, which can comprehensively reflect its health status and accurately assess its reliability. The paper will examine the EMC …

cn (code pays fourni par la source)

0 citations
2024 conference-paper OpenAlex

Electromagnetic Relay Suction Prediction Based on Improved Support Vector Regression

Yingzhu Han, Huimin Liang, Duanlin Jiang, Zitong Wei et autres

Support vector regression (SVR), a machine learning method based on statistical learning theory, is an effective tool for sample training and data prediction. However, limited by its own principles and mechanisms, SVR often needs to adjust internal parameters when facing outliers and …

cn (code pays fourni par la source)

0 citations
2023 article OpenAlex

A Heuristic Robust Design Optimization Approach for Batch Production Permanent Magnet Actuator Consider Various Uncertainties and Life-Cycle Quality Loss

Jun Tan, Hao Chen, Xuerong Ye, Guofu Zhai et autres

The design optimization of a robust, low-cost, and high-quality permanent magnet actuator (PMA) that meets the requirements of industrial applications presents numerous challenges. In particular, uncertainties arising from fabrication, assembly, and degradation are omnipresent and can produce erratic or infeasible solutions, complicating …

cn (code pays fourni par la source)

7 citations IEEE Transactions on Energy Conversion
2013 conference-paper OpenAlex

A robust design method to improve performance reliability based on degradation characteristic

Yuege Zhou, Xuerong Ye, Guofu Zhai

Component performance degradation and parameter drift due to the effects of environmental condition and operating stress causes the performance measures of electronic system to deviate from the initial design specifications. The non-conformance of performance measures over time is referred as performance reliability, …

cn (code pays fourni par la source)

2 citations

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