Accès ouvert
2026
article
OpenAlex
Fanzhi Su, May Ching Lai, Tianhao Wu, wei Huang et autres
Focused Ion Beam (FIB) milling enables electron microscopy (EM) studies of mate rial across diverse applications. However, the use of FIB on composite or beam-sensitive materials can cause curtaining artefacts compromising EM data quality. Existing mit igation approaches, such as optimised FIB …
Accès ouvert
2026
dataset
OpenAlex
Fanzhi Su, Tianhao Wu, Wei Huang, Jedrzej Morzy et autres
DecurtainNet Dataset is an extensive collection of over 22,000 electron microscopy (EM) images meticulously curated to develop and validate DecurtainNet, a UNet-based deep learning model aimed at automatically removing curtaining artefact revealed in EM images. Curtaining artefacts, resulting from uneven milling rates …
Accès ouvert
2026
dataset
OpenAlex
Fanzhi Su, Tianhao Wu, Wei Huang, Jedrzej Morzy et autres
DecurtainNet Dataset is an extensive collection of over 22,000 electron microscopy (EM) images meticulously curated to develop and validate DecurtainNet, a UNet-based deep learning model aimed at automatically removing curtaining artefact revealed in EM images. Curtaining artefacts, resulting from uneven milling rates …
Accès ouvert
2025
dissertation
OpenAlex
Fanzhi Su
The development of next-generation energy storage and optoelectronic devices, including lithium-ion batteries, perovskite solar cells, and light-emitting diodes (LEDs), relies on the ability to design materials with tailored structures and properties. A central challenge in materials science is to establish the link …
Accès ouvert
2023
article
OpenAlex
Felix Utama Kosasih, Fanzhi Su, Tian Du, Sinclair R. Ratnasingham et autres
Nanoscale materials characterization often uses highly energetic probes which can rapidly damage beam-sensitive materials, such as hybrid organic-inorganic compounds. Reducing the probe dose minimizes the damage, but often at the cost of lower signal-to-noise ratio (SNR) in the acquired data. This work …
gb
(code pays fourni par la source)