J. Clement

Tailoring the composition and deposition kinetics of RF-sputtered BaTiO3 thin films through working pressure and target-substrate distance adjustments

Edgar Chaslin, J. Clement, Quentin Simon, Alejandro Borroto et autres

fr (code pays fourni par la source)

Measurement of charged hadron multiplicity in Au+Au collisions at $$ \sqrt{{\textrm{s}}_{\textrm{NN}}} $$ = 200 GeV with the sPHENIX detector

M. I. Abdulhamid, U. Acharya, Emily R. Adams, G. Adawi et autres

us, jp, fr, hu, cn, tw (code pays fourni par la source)

Measurement of the transverse energy density in Au + Au collisions at s N N = 200 GeV with the sPHENIX detector

U. Acharya, Emily R. Adams, G. Adawi, C. Aidala et autres

us, jp, fr, hu, cn, tw (code pays fourni par la source)

Measurement of charged hadron multiplicity in Au+Au collisions at $\sqrt{\text{s}_{\text{NN}}} = 200$ GeV with the sPHENIX detector

SLD Collaboration, M. I. Abdulhamid, U. Acharya, Emily R. Adams et autres

Measurement of the transverse energy density in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV with the sPHENIX detector

SLD Collaboration, M. I. Abdulhamid, U. Acharya, Emily R. Adams et autres

Investigation of CMOS reliability in 28 nm through BTI and HCI extraction

Julien Coutet, François Marc, J. Clement

fr (code pays fourni par la source)

X-Ray Inspection: New Capabilities and Methodology for PCBA Analysis

Julien Perraud, Shaïma Enouz-Védrenne, J. Clement, Arnaud Grivon

fr (code pays fourni par la source)

Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories

Julien Coutet, François Marc, Flavien Dozolme, Romain Guétard et autres

fr, au (code pays fourni par la source)

IR Thermography for Temperature Measurements and Fault Location on AlGaN/GaN HEMTs and MMICs

Lény Baczkowski, Franck Vouzelaud, Dominique Carisetti, Nicolas Sarazin et autres

au, fr, de (code pays fourni par la source)

Critical failure mechanism of 0.25 µm AlGaN/GaN HEMT under severe stress test conditions

Dominique Carisetti, Nicolas Sarazin, Laurent Brunel, J. Clement et autres

de, fr, no (code pays fourni par la source)

Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques

W. Ben Naceur, Nathalie Malbert, Nathalie Labat, H. Frémont et autres

fr (code pays fourni par la source)

Infrared Thermography Developments for III-V Transistors and MMICs

Dominique Carisetti, Mohsine Bouya, Odile Bezencenet, Bernard Servet et autres

fr (code pays fourni par la source)