X-ray Diffraction Pattern for six Quaternary Mixed-Metal Chalcohalides - Sn2SbS2I3, Sn2InS2Br3, Sn2InSe2Br3, Sn2SbS2Cl3, Sn2SbSe2Cl3 and Sn2InSe2Cl3

Le résumé fourni par la source

This dataset contains the X-ray diffraction (XRD) patterns of six mixed-metal chalcohalide (MMCH) compounds, namely Sn₂SbS₂I₃, Sn₂InS₂Br₃, Sn₂InSe₂Br₃, Sn₂SbS₂Cl₃, Sn₂SbSe₂Cl₃, and Sn₂InSe₂Cl₃. The XRD measurements were carried out using a Bruker D8 Advance diffractometer operating in Bragg–Brentano geometry at 40 kV and 40 mA with Cu Kα₁ radiation (λ = 1.54187 Å). The XY files contain the measured 2θ angles and corresponding intensities over a 2θ range of 10°-60°. The data file naming follows Table S1 of the Supporting Information of our publication, “How Thermodynamically Accessible are Quaternary Mixed-Metal Chalcohalides?”. Each filename follows the structure: MMCH compound name – S – substrate information – annealing temperaturewhere S denotes the sample number corresponding to the sample listed in Table S1. The substrate information and annealing temperature specify the respective experimental conditions used for the sample.

Ce résumé expose les affirmations des auteurs. BNTIC ne l’interprète pas comme une validation indépendante des résultats.