Development of multipixel silicon drift detectors for x-rays

Résumé fourni par la source

The Pixelated silicon Drift Detector (PixDD) is a multi-pixel X-ray sensor based on the silicon drift technology on a 2D matrix of pixels with 300 micrometers pitch. The front-end ASIC, named RIGEL, has a 2D matrix of cells with sparse readout, fast response time, and good noise performance even at room temperature. Sensor and ASIC are interfaced using a die-level bump bonding technique. PixDD is an ideal focal plane sensor for X-ray concentrators and lobster-eye optics. An improvement of PixDD is the Imaging drift edgeless array for X-rays (IdeaX), recently approved in the framework of the PRORIS program. In IdeaX we plan to develop an edgeless system based on a pixelated silicon drift detector and two ASICs (front-end and back-end) interconnected using through-silicon vias and bump bonding. This approach aims to minimise the dead area on the focal plane. Here we present the measured performance of the existing 16 x 16 pixels prototype of PixDD and we discuss the IdeaX working plan.

Ce résumé expose les affirmations des auteurs. BNTIC ne l’interprète pas comme une validation indépendante des résultats.