Simulation of MKID Design Sensitivity to Fabrication Tolerances

Le résumé fourni par la source

Simulations of Microwave Kinetic Inductance Detectors (MKIDs) can be used to inform fabrication tolerances or design requirements. Frequency-domain multiplexing is used to allow thousands of MKIDs to be read on a single feedline. The signals are separated into frequency bins. For this to work, the resonant frequency$(f_{0})$of each pixel must fall into a unique frequency bin. This allows arrays of MKIDs to achieve simultaneous temporal, spatial, and energy resolution. We generate designs for MKIDs with progressive changes in key dimensions of their circuit elements. We simulate the frequency response of each design using Sonnet. We extract$f_{0}$, and plot how it varies with those dimensions. By doing so, we can determine the fabrication precision required to achieve a given frequency separation$(\Delta {f_{0}})$, or the$\Delta {f_{0}}$that can be achieved with a given fabrication tolerance.

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