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2025 conference-abstract

Development of a Miniature Gamma Camera Based on Pseudo-Random Pattern

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1Institutions déclarées
1Pays d’affiliation déclarés

Résumé fourni par la source

Energetic Particle Sensor for the Identification and Localization of Originating Nuclei-Gamma (EPSILON-G) was developed as a gamma camera in previous research. This gamma camera employs a coded-aperture mask based on a centered mosaic Modified Uniformly Redundant Arrays (MURAs). However, when the gamma-ray source is located outside the field of view, the MURA based mask produces artifacts on the opposite side of the actual source position. To address this issue, this study developed a coded-aperture mask based on a pseudo-random pattern. To validate the pseudo-random pattern, computational simulations were performed using Monte Carlo NPaticle eXtended (MCNPX)-PoliMi. The source term, defined to emit 662 keV gamma rays, was positioned 100 cm away from the coded-aperture mask at three separate locations: in front of, to the left of, and to the right of the mask. Computational simulations were conducted separately for two types of coded-aperture masks, and the results were compared. In addition, the two types of coded-aperture masks were implemented on the actual gamma camera to comparatively evaluate their performance. In this study, a miniature gamma camera composed of a Ce-doped 11 × 11 Gadolinium Aluminum Gallium Garnet (GAGG(Ce)) scintillator array, an 8 × 8 silicon photomultiplier (SiPM) array, a data processing board was used. Each gamma camera equipped with a different coded-aperture mask was evaluated in terms of image quality, field of view, angular resolution, and imaging sensitivity.

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Contrôle bibliographique ouvert

DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.

Titre Crossref
Development of a Miniature Gamma Camera Based on Pseudo-Random Pattern
Date Crossref
01/11/2025
Éditeur
IEEE
Type
proceedings-article

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Institutions déclarées

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Sujets associés

Radiation Detection and Scintillator TechnologiesMedical Imaging Techniques and ApplicationsAdvanced Semiconductor Detectors and Materials

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