EDMOT: A 25–65 ns Latency Event-Driven Multiobject Tracker for Dynamic Vision Sensors
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Le résumé fourni par la source
Dynamic vision sensors (DVSs), renowned for their low latency and sparse event-driven output, have garnered significant attention in machine vision applications, particularly in latency-sensitive applications like object tracking. However, current DVS-based object tracking systems have not fully utilized the advantages of DVS due to their frame-based processing or the high computing intensity of their algorithms. This brief presents EDMOT, a fully event-driven multiobject tracking system for DVS, achieving 25–65 ns latency at 200 MHz. EDMOT introduces three key innovations: 1) a novel event-driven update mechanism that processes only the latest event and the expired oldest event, minimizing computational overhead; 2) a dual-threshold tracking strategy that decouples object formation and motion phases, significantly improving tracking accuracy; and 3) a row–column feature memory with flag registers, enabling object separation within eight clock cycles. The proposed EDMOT is evaluated on public datasets, demonstrating superior tracking accuracy compared to prior methods. Finally, EDMOT was implemented at the HLMC 55 nm, supporting 20–100 Me/s throughput. To the best of our knowledge, this is a multiobject tracking system with minimal delay and the highest event processing throughput.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- EDMOT: A 25–65 ns Latency Event-Driven Multiobject Tracker for Dynamic Vision Sensors
- Date Crossref
- 01/02/2026
- Éditeur
- Institute of Electrical and Electronics Engineers (IEEE)
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Fudan University State Key Laboratory of Integrated Chips and Systems pays non établi dans la noticeUniversité ou école supérieure
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Shanghai ExploreX Technology Company Ltd. pays non établi dans la noticeEntreprise
State Key Laboratory of Integrated Chips and Systems — Fudan University et Shanghai ExploreX Technology Company Ltd..
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