SPAN: Learning Similarity Between Scene Graphs and Images With Transformers
Rattachement africain : de, au, gb. Niveau de preuve : code pays fourni par la source.
Le résumé fourni par la source
Learning similarity between scene graphs and images aims to estimate a similarity score given a scene graph and an image. There is currently no research dedicated to this task, although it is critical for scene graph generation and downstream applications. Scene graph generation is conventionally evaluated by Recall$@K$@K and mean Recall$@K$@K, which measure the ratio of predicted triplets that appear in the human-labeled triplet set. However, such triplet-oriented metrics fail to demonstrate the overall semantic difference between a scene graph and an image and are sensitive to annotation bias and noise. Using generated scene graphs in the downstream applications is therefore limited. To address this issue, for the first time, we propose a Scene graPh-imAge coNtrastive learning framework, SPAN, that can measure the similarity between scene graphs and images. Our novel framework consists of a graph Transformer and an image Transformer to align scene graphs and their corresponding images in the shared latent space. We introduce a novel graph serialization technique that transforms a scene graph into a sequence with structural encodings. Based on our framework, we propose R-Precision measuring image retrieval accuracy as a new evaluation metric for scene graph generation. We establish new benchmarks on the Visual Genome and Open Images datasets. Extensive experiments are conducted to verify the effectiveness of SPAN, which shows great potential as a scene graph encoder.
Ce résumé expose les affirmations des auteurs. BNTIC ne l’interprète pas comme une validation indépendante des résultats.
Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- SPAN: Learning Similarity Between Scene Graphs and Images With Transformers
- Date Crossref
- 01/03/2026
- Éditeur
- Institute of Electrical and Electronics Engineers (IEEE)
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Les institutions déclarées
Une affiliation ne permet pas de déduire la nationalité d’un auteur.