Single exposure X-ray nano-tomography in the near-field Fresnel regime with multilayer Laue lenses

Le résumé fourni par la source

Since the introduction of X-ray holotomography in projection geometry, this modality has proven to be highly effective for practical applications in the 100 nm spatial resolution range. However, one of the main obstacles to its implementation is the difficulty of producing a small focal spot, which determines the resolution of the projection microscope. To address this challenge, we present a simple optical scheme utilizing a pair of multilayer Laue lenses (MLLs). By integrating MLLs with a compound refractive lens (CRL) device and using phase-contrast imaging, we demonstrate a full-field, single exposure X-ray nano-tomography technique that achieves 218 nm resolution in just 100 seconds. In our near-field holographic setup, we achieve a resolution of ≈160 nm, demonstrating the effectiveness of the system for high-resolution imaging. Additionally, we demonstrate quantitative holographic imaging that highlights the trade-off between photon flux and spatial coherence. This trade-off plays a crucial role in balancing the need for high photon flux for fast imaging while maintaining the quality of the phase reconstruction. Our optical scheme is particularly well-suited for new generation synchrotron beamlines, where physical space for mirror-based focusing optics is limited.

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