Statistically elucidated responses from low-signal contrast mechanisms in ultrafast electron microscopy
Rattachement africain : us. Niveau de preuve : code pays fourni par la source.
Le résumé fourni par la source
The emergence of ultrafast electron microscopy (UEM) has enabled the discovery of strongly correlated dynamic mechanisms, including electron–phonon coupling, structural phase transitions, thermal transport, and electromagnetic deflection. Most UEM systems operate stroboscopically, meaning that the technique is susceptible to artifacts, mistakes, and misinterpretation of the data due to extensive experimental effort. In contrast to the ultrafast designation, data acquisition is extraordinarily slow because the electron beam has significantly reduced signal compared to traditional transmission electron microscopy due to pulsing the electron beam. Consequently, the sample may drift, tilt, or undergo irreversible structural changes that are independent of the time-resolved dynamics throughout the experimental time frame. Furthermore, these datasets require significant user interpretation that can be problematic when proper controls are not implemented thoroughly. Here, we demonstrate a new algorithm designed to separate ultrafast structural dynamics from long-term artifacts using a LiNbO3 sample experiencing electrically driven surface acoustic wave propagation. Additionally, we provide examples of the impact of user bias when analyzing the data and provide a methodology, which enables the extraction of time-resolved responses when the image signal is extraordinarily low. Overall, the goal of this publication is to provide methods that validate the experimental results and reduce researcher biases during UEM data interpretation.
Ce résumé expose les affirmations des auteurs. BNTIC ne l’interprète pas comme une validation indépendante des résultats.
Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Statistically elucidated responses from low-signal contrast mechanisms in ultrafast electron microscopy
- Date Crossref
- 01/05/2025
- Éditeur
- AIP Publishing
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
-
Brookhaven National Laboratory Condensed Matter Physics and Materials Science Department pays non établi dans la noticeStructure de recherche
-
Stony Brook University Department of Physics and Astronomy pays non établi dans la noticeUniversité ou école supérieure
-
Euclid Techlabs (United States) pays non établi dans la noticeEntreprise
-
National Institute of Standards and Technology Office of Data and Informatics pays non établi dans la noticeOrganisme public
-
University of Maryland Department of Materials Science and Engineering pays non établi dans la noticeUniversité ou école supérieure
-
Euclid Techlabs LLC 3 pays non établi dans la noticeInstitution
Condensed Matter Physics and Materials Science Department — Brookhaven National Laboratory, Department of Physics and Astronomy — Stony Brook University et Euclid Techlabs (United States), avec 3 autres affiliations.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.