The meV-resolved Inelastic X-ray Scattering Beamline at NSLS-II: Design and Performance

Le résumé fourni par la source

Abstract The ultrahigh resolution inelastic X-ray scattering (IXS) beamline at NSLS-II is designed and built to achieve sub-meV resolution at a moderate energy of 9.13 keV for IXS experiments with high momentum resolution and high spectral contrast. The key instrument is a novel spectrometer featuring a new type of analyzer optics, which combines post-sample collimation with angular dispersive crystal optics. As the first user instrument of its kind, the spectrometer has demonstrated unique research capabilities in exploring low momentum transfer (Q), THz dynamics in soft material systems characterized by mesoscopic heterogeneity and complexity, such as liquid crystals and bio-membranes. Ongoing efforts to improve performance since the start of user operations have resulted in a state-of-the-art energy resolution in routine operations of less than 1.4 meV, with sharp Gaussian-like tails, making it a premier IXS spectrometer for studying the dynamics of soft materials, while also delivering competitive performance for investigating phonon dynamics in hard condensed matter systems, including a broad range of quantum materials.

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