Status of the Cryogenic Anti-Coincidence Detector (CryoAC) for the Athena X-Ray Integral Field Unit (X-IFU)
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Le résumé fourni par la source
The Cryogenic Anti-Coincidence detector (CryoAC) is a critical component of the Athena X-ray Integral Field Unit (X-IFU), in order to fully exploit the instrument performance in the pursuit of high-resolution X-ray spectroscopy with Transition Edge Sensor (TES) detectors. Athena will be the upcoming large X-ray observatory by the European Space Agency (ESA) spanning the energy range of 0.2 to 12 keV. Recently, the mission has successfully undergone a redefinition process to align with new parameters set by ESA, and the launch is now scheduled for the mid-2030 s. The X-ray Integral Field Unit (X-IFU) represents one of the two instrumental components within the payload, functioning as a cryogenic spectrometer with a spectral resolution of about 4 eV at 7 keV. In this configuration, the CryoAC serves to mitigate the impact of cosmic ray-induced events on the spectrometer TES detectors, which compromises the sensitivity of X-ray measurements. The detector aims to identify and veto non-X-ray events, allowing measurement of faint or distant X-ray sources that will be submerged by background events. In particular, we will present the design and first experimental results of a new CryoAC sample, namely DM#144, developed on the basis of the experience gained with the last CryoAC prototypes. It is a possible candidate for the CryoAC DM1.1, the model to be tested in the future X-IFU FPA Demontration Model 1.1 campaign. Our goal is to provide a comprehensive overview of the current status of the CryoAC for the Athena X-IFU TES detector, offering valuable insights into the ongoing development an design changes of the detector.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Status of the Cryogenic Anti-Coincidence Detector (CryoAC) for the Athena X-Ray Integral Field Unit (X-IFU)
- Date Crossref
- 01/08/2025
- Éditeur
- Institute of Electrical and Electronics Engineers (IEEE)
- Type
- journal-article
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