Study of the damage properties of high damage threshold, broadband composite high-reflection thin films at 532 nm
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Le résumé fourni par la source
In response to the significant demand for high-damage threshold, broadband high-reflection films for high-power laser systems, composite high-reflection films have been developed. The composite high-reflection films combine the advantages of high-damage threshold materials with the advantages of high-refractive index materials by adding several cycles of high-damage threshold material Al₂O₃/SiO₂ on the surface of traditional Ta₂O₅/SiO₂ high-reflection films. The impact of the number of the Al₂O₃/SiO₂ protective layer cycles on the damage resistance of the composite high-reflection films in the 532nm band is examined. The 1-on-1 laser damage test demonstrated that there was no significant distinction in the laser damage threshold of the composite films with three or six cycles of protective layer. This was primarily due to the presence of various impurities and defects in the films. Six cycles of protective layer protection were found to be more effective. All laser damage of the composite films with six cycles protective layer was observed to occur within the protective layer. Moreover, the interface of Al₂O₃/SiO₂ and Ta₂O₅/SiO₂ was identified as a potential weak region in the composite films. This study provides a valuable reference for the subsequent application of composite dielectric films in high-power laser systems.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Study of the damage properties of high damage threshold, broadband composite high-reflection thin films at 532 nm
- Date Crossref
- 08/11/2024
- Éditeur
- SPIE
- Type
- proceedings-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Shanghai Institute of Optics and Fine Mechanics pays non établi dans la noticeStructure de recherche
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University of Chinese Academy of Sciences pays non établi dans la noticeUniversité ou école supérieure
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Univ. of Chinese Academy of Sciences (China) pays non établi dans la noticeStructure de recherche
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CAS Ctr. for Excellence in Ultra-Intense Laser Science (China) pays non établi dans la noticeInstitution
Shanghai Institute of Optics and Fine Mechanics, University of Chinese Academy of Sciences et Univ. of Chinese Academy of Sciences (China), avec 1 autre affiliation.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.