The Vertical Integrated Spectrometer (VIS) focal plane: orders of magnitude improvement in mm-wave Line Intensity Mapping (LIM) with an inline waveguide-to-on-chip transition
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Le résumé fourni par la source
Scalable, densely packed spectrometer arrays (integral field units, or IFUs) would enable intensity mapping sensitive enough for precision measurements of cosmology and astrophysics in a new redshift regime. This scalability requires a new architecture, with spectrometers oriented parallel with incident light. The key technology required is an inline waveguide-to-coplanar-waveguide transition. We present a millimeter-wave IFU concept that includes this new transition with on-chip kinetic-inductance-based spectrometers. The transition was designed with efficient Bayesian optimization and made robust to manufacturing tolerance with a novel optimization algorithm. It has >95% coupling over an octave bandwidth for 95% of randomly sampled transitions within tolerance. The design approach is of general interest to many instrument design problems; a Python implementation of the algorithm alongside an extension that automates a widely-used mesh-based EM solver are made publicly available. We also present the status of our efforts to fabricate transition prototypes in the 85--170 GHz band.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- The Vertical Integrated Spectrometer (VIS) focal plane: orders of magnitude improvement in mm-wave Line Intensity Mapping (LIM) with an inline waveguide-to-on-chip transition
- Date Crossref
- 17/08/2024
- Éditeur
- SPIE
- Type
- proceedings-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
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