LASDNet: A Lightweight Adaptive Surface Defect Detection Network
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Le résumé fourni par la source
Surface defect detection is an important task in industry. However, surface defect detection still faces many challenges, including variations in aspect ratios, similarity with the background, and difficulty in detecting small defects. In this paper, we propose LASDNet, a novel model for defect detection. LASDNet generates predictions for three different categories: the center point of the defect, the offset of the center point, and the size of the defect. The location of the defect is determined by its center point and size, with the center point being adjusted by the offset. Firstly, an adaptive module is designed to generate the ground truth heatmap based on the shape of the defect, thereby enhancing the precision of the ground truth. Secondly, the hourglass backbone is optimized by redesigning the structure to enhance its capacity for detecting small defects. Finally, an intermediate supervision module is proposed to utilize multi-scale features to locate the defect from rough to precise. Our proposed LASDNet model outperformed all its peers on the public rail defect dataset (RRTD) and shot-circuit defects of printed circuit boards dataset (PCB).
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- LASDNet: A Lightweight Adaptive Surface Defect Detection Network
- Date Crossref
- 14/04/2024
- Éditeur
- IEEE
- Type
- proceedings-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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University of Chinese Academy of Sciences pays non établi dans la noticeUniversité ou école supérieure
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State Key Laboratory of Remote Sensing Science pays non établi dans la noticeStructure de recherche
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Beijing Institute of Remote Sensing Equipment pays non établi dans la noticeStructure de recherche
University of Chinese Academy of Sciences, State Key Laboratory of Remote Sensing Science et Beijing Institute of Remote Sensing Equipment.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.