Experimental Study on the X-ray Diffraction Analysis of Cu2O Growth Caused by Incomplete Contact in Wire Connections

Le résumé fourni par la source

An electrical fire caused by contact failure leaves unusual features such as an excessive oxidation of copper wire, which is an electrical singularity mainly found in wire connections. Previously, in order to determine the Cu2O growth in wire connections, detecting the thinning shape of the wire, confirming the presence of easily broken reddish-purple oxide, and analyzing the component ratio of each element through SEM-EDS(Scanning Electron Microscope-Energy Dispersive Spectrometer) were performed. In this study, we suggest a method to confirm the Cu2O growth in wire connections through X-ray diffraction patterns and component ratio analysis obtained from contact failure samples taken from fire scenes. The presence of Cu2O was clearly confirmed in each sample, and it is expected to provide a reliable results in determining the cause of fire.

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