Impact of Back-Gate Bias and Body-Tie on the DSOI SRAMs Under Total Ionizing Dose Irradiation

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The total ionizing mymargin dose mymargin (TID) effect is systematically investigated in the double silicon-on-insulator (DSOI) static random access memory (SRAM) circuits, taking into consideration: silicon film thicknesses, floating/unfloating body, and back-gate bias. It is experimentally demonstrated that the SRAM circuits with thinner silicon layer (45 nm) and floating-body transistors exhibit better radiation tolerance, with a corresponding decrease in read current by 3.8% and an increase in access time by 34.7%. This can be attributed to enhanced back-gate tuning ability, which increased from 2.17% to 8.62% for nMOS and from 8.6% to 34.7% for pMOS. A back-gate bias of −3 V is sufficient to compensate for the degradation with total dose accumulated up to 1 Mrad(Si). Technology computer-aided design (TCAD) simulations indicate that the electric field gradually saturates near the first buried oxide (BOX) for a thicker silicon layer, weakening the modulation ability of back-gate bias. Compared with floating devices, the tuning range is reduced for devices with body-tie (unfloating body), and higher back-gate voltages can significantly strengthen the electric field in the channel, around three times. This results in a substantial increase in the channel current, implying that the back-gate bias cannot be increased unrestrictedly.

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