Ionic liquid gating induced insulating phase transition in LaNiO3 thin films
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Le résumé fourni par la source
Perovskite rare-earth nickelates exhibit intriguing electrical and optical properties, such as metal-to-insulator transitions, resulting from the strong interplay between charge disproportionation and electron correlation. Of these materials, lanthanum nickelate, ${\mathrm{LaNiO}}_{3}$, is the only exception where the metallic phase is robust at all temperatures. Recently, significant efforts have been made to induce an insulating phase in ${\mathrm{LaNiO}}_{3}$ by dimensionality or stoichiometry control. Electrolyte gating can be an efficient alternative to manipulate such electronic behavior reversibly and controllably. In this work, we performed systematic ionic liquid gating studies with electric double-layer transistor devices to control the electronic properties of ${\mathrm{LaNiO}}_{3}$. The electrolyte gating in ${\mathrm{LaNiO}}_{3}$ leads to an insulating phase transition with an increased film resistivity by over six orders of magnitude. The electrolyte gating behaviors are found to be dependent on not only gating voltage and duration, but also the atmospheric environment and temperature. X-ray photoelectron spectroscopy analysis reveals that the ionic liquid gating changes the O vacancy concentration and Ni valence state with varying gating times. The phase transition is attributed to enhanced electron correlation as well as opening of the charge transfer gap due to the reduced overlap between Ni and O bands. Intriguingly the filling of carriers into the Mott-Hubbard gap vs charge transfer gap is controlled by the gate voltage. These results suggest that electrolyte gating devices can be useful for manipulating electron-electron correlation, boosting materials research to realize exotic physics in correlated systems.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé, mais le titre doit être comparé manuellement.
- Titre Crossref
- Ionic liquid gating induced insulating phase transition in <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi>LaNiO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math> thin films
- Date Crossref
- 22/12/2023
- Éditeur
- American Physical Society (APS)
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Maryland Quantum Materials Center pays non établi dans la noticeUniversité ou école supérieure
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University of Maryland Department of Materials Science and Engineering pays non établi dans la noticeUniversité ou école supérieure
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National Institute of Standards and Technology pays non établi dans la noticeOrganisme public
Maryland Quantum Materials Center, Department of Materials Science and Engineering — University of Maryland et National Institute of Standards and Technology.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.