Bayesian Analysis of Lifetime Delayed Degradation Process for Destructive/Nondestructive Inspection
Rattachement africain : cn, hk. Niveau de preuve : code pays fourni par la source.
Le résumé fourni par la source
Degradation has become the dominant failure mode for highly reliable engineering systems. Cracking, a fatigue phenomenon composed of sequential phases of crack initiation and propagation, is a major concern for critical aircraft structures. Traditional fracture mechanics analysis cannot fully meet the requirements for assessing reliability indicators from a reliability analysis perspective. Alternatively, the empirical Lifetime Delayed Degradation Process (LDDP) provides an explanatory framework for sequential hard&soft failure mode. This study further generalizes the LDDP framework by introducing the Bayesian method as a Bayes-LDDP model, which incorporates a weakly informative prior derived from historical data of similar systems for both non-destructive and destructive inspections. Additionally, we compare our proposed method to the LDDP approach using specific inspection datasets. Two practical applications are conducted to demonstrate the effectiveness of the Bayes-LDDP model for reliability monitoring and remaining useful life (RUL) prediction in critical aircraft structures using field data. The crack inspection datasets of a transport aircraft and an aircraft core automated maintenance system (CAMS) are utilized for non-destructive and destructive inspections, respectively. The Markov Chain Monte Carlo (MCMC) sampling algorithm is adopted for the Bayes-LDDP, improving the computational efficiency of model parameters estimation compared to the stochastic expectation maximum (SEM) algorithm. Furthermore, the Bayes-LDDP model enables precise inference including the mean time to failure (MTTF) of cracks for destructive inspections and the RUL for non-destructive inspections under the selected optimal model. This extended novel framework provides a clear depiction of the lifetime delayed degradation process from a Bayesian perspective.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Bayesian Analysis of Lifetime Delayed Degradation Process for Destructive/Nondestructive Inspection
- Date Crossref
- 01/06/2024
- Éditeur
- Institute of Electrical and Electronics Engineers (IEEE)
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Chinese Academy of Sciences Academy of Mathematics and Systems Science pays non établi dans la noticeOrganisme public
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Academy of Mathematics and Systems Science pays non établi dans la noticeStructure de recherche
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City University of Hong Kong Department of Systems Engineering pays non établi dans la noticeUniversité ou école supérieure
Academy of Mathematics and Systems Science — Chinese Academy of Sciences, Academy of Mathematics and Systems Science et Department of Systems Engineering — City University of Hong Kong.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.