The Blinking of Small-Angle X-ray Scattering Reveals the Degradation Process of Protein Crystals at Microsecond Timescale
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Le résumé fourni par la source
X-ray crystallography has revolutionized our understanding of biological macromolecules by elucidating their three-dimensional structures. However, the use of X-rays in this technique raises concerns about potential damage to the protein crystals, which results in a quality degradation of the diffraction data even at very low temperatures. Since such damage can occur on the micro- to millisecond timescale, a development in its real-time measurement has been expected. Here, we introduce diffracted X-ray blinking (DXB), which was originally proposed as a method to analyze the intensity fluctuations of diffraction of crystalline particles, to small-angle X-ray scattering (SAXS) of a lysozyme single-crystal. This novel technique, called the small-angle X-ray blinking (SAXB) method, analyzes the fluctuation in SAXS intensity reflecting the domain fluctuation in the protein crystal caused by the X-ray irradiation, which could be correlated with the X-ray-induced damage on the crystal. There was no change in the protein crystal's domain dynamics between the first and second X-ray exposures at 95K, each of which lasted 0.7 s. On the other hand, its dynamics at 295K increased remarkably. The SAXB method further showed a dramatic increase in domain fluctuations with an increasing dose of X-ray radiation, indicating the significance of this method.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- The Blinking of Small-Angle X-ray Scattering Reveals the Degradation Process of Protein Crystals at Microsecond Timescale
- Date Crossref
- 23/11/2023
- Éditeur
- MDPI AG
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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National Institute of Advanced Industrial Science and Technology pays non établi dans la noticeOrganisme public
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The University of Tokyo pays non établi dans la noticeUniversité ou école supérieure
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Nagoya University Synchrotron Radiation Research Center pays non établi dans la noticeUniversité ou école supérieure
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Japan Synchrotron Radiation Research Institute Center for Synchrotron Radiation Research pays non établi dans la noticeStructure de recherche
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AIST-UTokyo Advanced Operando-Measurement Technology Open Innovation Laboratory (OPERANDO-OIL) pays non établi dans la noticeStructure de recherche
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Graduate School of Frontier Sciences Department of Advanced Materials Science pays non établi dans la noticeUniversité ou école supérieure
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Graduate School of Engineering Department of Applied Physics pays non établi dans la noticeUniversité ou école supérieure
National Institute of Advanced Industrial Science and Technology, The University of Tokyo et Synchrotron Radiation Research Center — Nagoya University, avec 4 autres affiliations.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.