Digital Circuit for Fast Scan Voltammetry Based on Dual-Frequency Method
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Le résumé fourni par la source
Abstract In this work, a digital circuit for fast scan voltammetry (FSV) was developed based on dual-frequency method. It consists of six main modules including the microcontroller unit, signal generator module, solution resistance measurement module, ohmic drop automatic compensation module, keying module and display module. By online measuring the solution resistance without any interference from capacitive impedance first, the ohmic drop compensation could be precisely carried out, bringing reliable FSV detection. RC dummy cell, dummy cell with pseudo-Faradaic impedance and actual electrochemical cell were used to verify the performance of automatic ohmic drop compensation. Results show that, FSV could be performed using a conventional electrode with the scan rate up to 2400 V/s. And, a handheld device was manufactured with a weight of 100 g and a size of 9 × 6 × 3 cm, costing only $35. It provides a simple, reliable and stable FSV plateau for electrochemical detection.
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Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Digital Circuit for Fast Scan Voltammetry Based on Dual-Frequency Method
- Date Crossref
- 01/10/2023
- Éditeur
- Pleiades Publishing Ltd
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
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Ningbo University pays non établi dans la noticeUniversité ou école supérieure
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Faculty of Electrical Engineering and Computer Science State Key Laboratory for Managing Biotic and Chemical Threats to the Quality and Safety of Agro-products pays non établi dans la noticeUniversité ou école supérieure
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School of Materials Science and Chemical Engineering State Key Laboratory for Managing Biotic and Chemical Threats to the Quality and Safety of Agro-products pays non établi dans la noticeUniversité ou école supérieure
Ningbo University, State Key Laboratory for Managing Biotic and Chemical Threats to the Quality and Safety of Agro-products — Faculty of Electrical Engineering and Computer Science et State Key Laboratory for Managing Biotic and Chemical Threats to the Quality and Safety of Agro-products — School of Materials Science and Chemical Engineering.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.