Reflection imaging with a helium zone plate microscope

Le résumé fourni par la source

Neutral helium atom microscopy is a novel microscopy technique that offers strictly surface-sensitive, non-destructive imaging. Several experiments have been published in recent years where images are obtained by scanning a helium beam spot across a surface and recording the variation in scattered intensity at a fixed total scattering angle $θ_{sd}$ and fixed incident angle $θ_{i}$ relative to the overall surface normal. These experiments used a spot obtained by collimating the beam (referred to as helium pinhole microscopy). Alternatively, a beam spot can be created by focusing the beam with an atom optical element. However up till now imaging with a focused helium beam (referred to as helium zone plate microscopy) has only been demonstrated in transmission. Here we present the first reflection images obtained with a focused helium beam. Images are obtained with a spot size (FWHM) down to 4.7 $μ$m $\pm$ 0.5 $μ$m, and we demonstrate focusing down to a spot size of about 1 $μ$m. Furthermore, we present the first experiments measuring the scattering distribution from a focused helium beam spot. The experiments are done by varying the incoming beam angle $θ_{i}$ while keeping the beam-detector angle $θ_{sd}$ and the point where the beam spot hits the surface fixed - in essence, a microscopy scale realization of a standard helium atom scattering experiment. Our experiments are done using an electron bombardment detector with adjustable signal accumulation, developed particularly for helium microscopy.

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