Micromachined Accelerometers With Optical Interferometric Read-Out and Integrated Electrostatic Actuation
Rattachement africain : us. Niveau de preuve : code pays fourni par la source.
Le résumé fourni par la source
A micromachined accelerometer device structure with diffraction-based optical detection and integrated electrostatic actuation is introduced. The sensor consists of a bulk silicon proof mass electrode that moves vertically with respect to a rigid diffraction grating backplate electrode to provide interferometric detection resolution of the proof-mass displacement when illuminated with coherent light. The sensor architecture includes a monolithically integrated electrostatic actuation port that enables the application of precisely controlled broadband forces to the proof mass while the displacement is simultaneously and independently measured optically. This enables several useful features such as dynamic self-characterization and a variety of force-feedback modalities, including alteration of device dynamics in situ. These features are experimentally demonstrated with sensors that have been optoelectronically integrated into sub-cubic-millimeter volumes using an entirely surface-normal, rigid, and robust embodiment incorporating vertical cavity surface emitting lasers and integrated photodetector arrays. In addition to small form factor and high acceleration resolution, the ability to self-characterize and alter device dynamics in situ may be advantageous. This allows periodic calibration and in situ matching of sensor dynamics among an array of accelerometers or seismometers configured in a network.
Ce résumé expose les affirmations des auteurs. BNTIC ne l’interprète pas comme une validation indépendante des résultats.
Le contrôle bibliographique ouvert
DOI retrouvé dans Crossref DOI retrouvé ; titre concordant.
- Titre Crossref
- Micromachined Accelerometers With Optical Interferometric Read-Out and Integrated Electrostatic Actuation
- Date Crossref
- 01/02/2008
- Éditeur
- Institute of Electrical and Electronics Engineers (IEEE)
- Type
- journal-article
Ce recoupement confirme des métadonnées liées au DOI. Il ne confirme ni la méthode ni les conclusions de l’étude, et il ne compte pas comme une seconde source scientifique indépendante.
Où se fait cette recherche
-
Sandia National Laboratories pays non établi dans la noticeStructure de recherche
-
Georgia Institute of Technology pays non établi dans la noticeUniversité ou école supérieure
-
School of Mechanical Engineering pays non établi dans la noticeUniversité ou école supérieure
Sandia National Laboratories, Georgia Institute of Technology et School of Mechanical Engineering.
Une affiliation ne permet pas de déduire la nationalité d’un auteur.