Mapping and Migrating Reflected Surface Waves

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Summary Identifying sharp lateral change in the near-surface is needed to accurately locate anomalies. We directly account for sharp lateral change by imaging surface wave reflections. We first show synthetic and field results from a processing flow that produces a space-depth reflectivity map across a seismic survey line. Then we use wave-equation migration to image surface-wave reflections adjacent to the survey line. Our results indicate that reflectivity images from both imaging methods can be used as an attribute in highlighting the location of anomalies and faulting. Using wave-equation migration with an imaging condition based on deconvolution resolves sharp discontinuities at high resolution while preserving polarity of the reflection. Frequency dependent surface-wave reflectivity is converted to depth resulting in 2D and 3D images.

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