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Institution scientifique

National Institute of Metrology

Beijing · CN · other

6388Publications signalées
146625Citations signalées
12Thèmes principaux

Principaux domaines

Scientific Measurement and Uncertainty EvaluationAdvanced Electrical Measurement TechniquesSensor Technology and Measurement SystemsCalibration and Measurement TechniquesAdvanced Frequency and Time StandardsAdvanced Sensor Technologies ResearchMass Spectrometry Techniques and ApplicationsAdvanced Measurement and Metrology TechniquesAtomic and Subatomic Physics ResearchAnalytical Chemistry and ChromatographyAdvanced Fiber Laser TechnologiesMicrowave and Dielectric Measurement Techniques

Évolution annuelle

198714
198820
198916
199113
199316
200247
200323
200440
200533
200655
200779
2008115
200994
2010148
2011159
2012230
2013207
2014250
2015227
2016243
2017230
2018304
2019310
2020357
2021361
2022398
2023493
2024535
2025649
2026507

Publications récentes

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