Quantitative 3D-Defect Localization Using Lock-In Thermography Based on Lateral Phase Characteristics
Sebastian Brand, Michael Koegel, Christian U. Große, Frank Altmann et autres
Abstract The paper discusses enhancements in quantitative thermal lockin inspection (LIT) through analysis of the spatial phase distribution for precise defect localization in complex microelectronic components. It addresses the challenges that arise from increasing integration density and diversification in material composition in …
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